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    Path of Most Resistance.

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    Date Created:
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    Path of Most Resistance.

    FT. BELVOIR, VIRGINIA, UNITED STATES

    09.08.2021

    Courtesy Photo

    Defense Threat Reduction Agency's Chemical and Biological Technologies Department

    Scanning electron micrograph of E. coli grown in culture and adhered to a cover slip. (National Institute of Allergy and Infectious Diseases image)

    IMAGE INFO

    Date Taken: 09.08.2021
    Date Posted: 09.08.2021 16:02
    Photo ID: 6823233
    VIRIN: 210908-D-D0490-002
    Resolution: 2083x1385
    Size: 492 KB
    Location: FT. BELVOIR, VIRGINIA, US

    Web Views: 51
    Downloads: 11

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