OSU student Julia Deitz uses state-of-the-art electron microscopes to push the boundaries of precision metrology techniques for advanced materials characterization.
Date Taken: | 06.21.2018 |
Date Posted: | 07.10.2018 09:48 |
Photo ID: | 4544547 |
VIRIN: | 180621-F-EK602-001 |
Resolution: | 567x662 |
Size: | 104.59 KB |
Location: | COLUMBUS, OH, US |
Web Views: | 34 |
Downloads: | 4 |
This work, AFRL collaborates with OSU on $3 million congressional microscopy program [Image 2 of 2], by Donna M Lindner, identified by DVIDS, must comply with the restrictions shown on https://www.dvidshub.net/about/copyright.
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