TWO-PHASE EXTENDED EVALUATION IN MICROGRAVITY CALIBRATION FACILITY - VOID FRACTION SENSOR ASSEMBLY INCLUDED
NASA Identifier: C-1997-124
| Date Taken: | 09.09.2009 |
| Date Posted: | 02.08.2013 07:03 |
| Photo ID: | 839384 |
| Resolution: | 2000x2500 |
| Size: | 1.11 MB |
| Location: | WASHINGTON, D.C., US |
| Web Views: | 4 |
| Downloads: | 1 |
