Sandia National Laboratories researcher Armin Doerry has been named a SPIE fellow for his work on imaging microwave radar technology.
| Date Taken: | 01.29.2011 |
| Date Posted: | 06.21.2016 14:49 |
| Photo ID: | 2677989 |
| VIRIN: | 110129-A-RM651-001 |
| Resolution: | 250x344 |
| Size: | 46.22 KB |
| Location: | ALBUQUERQUE, NEW MEXICO, US |
| Web Views: | 15 |
| Downloads: | 1 |
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