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A sample is loaded into the Bruker Atomic Force Microscope system capable of performing nanoscale imaging experiments.
| Date Taken: | 12.03.2020 |
| Date Posted: | 12.16.2020 22:59 |
| Photo ID: | 6460684 |
| VIRIN: | 201211-F-JZ995-003 |
| Resolution: | 4464x2976 |
| Size: | 4.64 MB |
| Location: | WRIGHT-PATTERSON AIR FORCE BASE, OHIO, US |
| Web Views: | 31 |
| Downloads: | 9 |
This work, AFRL researchers, partners uncover hidden features in two-dimensional materials [Image 2 of 2], by Donna M Lindner, identified by DVIDS, must comply with the restrictions shown on https://www.dvidshub.net/about/copyright.
AFRL researchers, partners uncover hidden features in two-dimensional materials
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