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Douglass Bryant, a materials engineer of Naval Surface Warfare Center Philadelphia Division (NSWCPD), carefully places a sheered screw into a scanning electron microscope (SEM) at the Navy Yard in Philadelphia Aug. 30, 2017.SEMs provide engineers like Bryant with a high-resolution, high-magnification image of materials that have failed in the fleet, to discover if the part failed from normal wear and tear or environmental causes such as exposure to extreme temperatures or corrosive chemicals. (U.S. Navy photo by Petty Officer 1st Class Richard Hoffner/Released)
| Date Taken: | 08.30.2017 |
| Date Posted: | 10.05.2017 00:45 |
| Photo ID: | 3830261 |
| VIRIN: | 170830-N-VP310-006 |
| Resolution: | 5107x3648 |
| Size: | 10.27 MB |
| Location: | PHILADELPHIA, PENNSYLVANIA, US |
| Web Views: | 38 |
| Downloads: | 5 |
This work, 170830-N-VP310-006 [Image 2 of 2], by PO1 Richard Hoffner, identified by DVIDS, must comply with the restrictions shown on https://www.dvidshub.net/about/copyright.
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